Senior IC Failure Analysis Engineer

NVIDIA's networking IC product engineering team is looking for a talented engineer to join the growing failure analysis team. The successful candidate will support various activities of IC failures investigations to enable smooth products bring up, optimize yield and quality, handle customer returns, and be a critical part of product qualification that requires root cause finding for every failure encountered.

Responsibilities

• Utilize testers and different hardware in combination with optical fault isolation techniques such as Laser stimulations (OBIRCH, LADA, etc.), Laser probing and emission microscopy, to detect defects, chip design marginalities, process issues, etc.
• Modify test programs to fit failure analysis requirements.
• Interpret ATPG diagnosis reports.
• Based on the OFI/diagnosis findings, prepare plans for nano-probing and guide Physical Failure Analysis engineers in their work and Physical Failure Analysis plan.
• Prepare technical reports summarizing the findings.
• Develop novel and existing debug techniques.
• Work directly with job requestors (Q&R, Foundry, physical design) and supporting teams (Test, DFT, SW, physical design).

Requirements

• B.Sc. in Electrical/Computer Engineering, Physics, Materials Science, or related field with 5+ years of relevant experience; or M.Sc. with 3+ years; or Ph.D.
• Good understanding of VLSI circuit design, and/or device physics, and/or process engineering.
• Ability to work independently and as part of a team.
• Strong sense of ownership, commitment, and responsibility.
• Effective oral and written communication skills.
• Strong analytical problem-solving skills.

Preferred Qualifications

• Experience in Failure analysis, Si debug, ATE test development, or nanoprobing.
• Familiarity with ATE Test Programs and ability to adopt Test Patterns per debug needs.
• Statistical/data analysis experience (Matlab, JMP, etc.).
• Hands-on experience with different OFI techniques such as laser stimulations, laser probing, photon emission, thermal emission.
• Background with electronic test equipment: scopes, spectrum analyzers, lock-in amplifiers, parametric analyzers, VNA, TDR, etc.